| E1000453-v1 |
Optical Contamination Test Results EP30-2 Bonded Quartz Glass Disks |
Dennis Coyne et al. |
Fabrication
|
02 Sep 2020 |
| E1800020-v1 |
Optical Contamination Test resuits: EPO-TEK 302-3M adhesive |
Dennis Coyne et al. |
Vacuum
Fabrication
System Engineering
|
27 Feb 2020 |
| E1000374-v1 |
RGA Test Results: A-OSEM heads with wound coil (quantity = 404) |
Dennis Coyne et al. |
Vacuum
System Engineering
|
16 Jul 2019 |
| E1000235-v1 |
Material Qualification RGA Test Results: New Focus Picomotor 830X-UHV |
Bob Taylor |
System Engineering
Vacuum
|
19 Jun 2019 |
| E1800216-v1 |
Procedure to test water and air outgassing contribution from components |
Calum Torrie et al. |
Operations
System Engineering
|
29 Aug 2018 |
| E1600086-v1 |
Material Qualification RGA Test Results: High Quantum Efficiency InGaAs Photodiode |
Dennis Coyne et al. |
Sensing and Control
Vacuum
System Engineering
|
12 May 2016 |
| E1500028-v1 |
Helium Bomb Testing Procedure |
Dennis Coyne et al. |
Vacuum
|
28 Aug 2015 |
| E1500248-v1 |
Helium Leak Test Procedure for the TMDS Ionizer Assembly |
Nichole Washington et al. |
Vacuum
|
23 Jul 2015 |
| E1400348-v1 |
Fast Shutter Calculated Coil Temperature |
Bob Taylor et al. |
Sensing and Control
Fabrication
|
24 Feb 2015 |
| E1400245-v3 |
RFPD Welded Enclosure Test and Bake Procedure |
Bob Taylor |
Vacuum
|
20 Jan 2015 |
| T1400684-v1 |
Fast Shutter Coil Temperature Analysis |
Rich Abbott et al. |
Sensing and Control
|
20 Jan 2015 |
| T1400341-v2 |
Maximum B-OSEM Current |
Dennis Coyne et al. |
Subsystem Test
Suspensions
Vacuum
|
09 Jul 2014 |
| E1000298-v1 |
Material Qualification RGA Test Results: Semitron ESD 480 PEEK |
Dennis Coyne et al. |
Fabrication
|
19 May 2014 |
| E1000386-v1 |
Material Qualification RGA Test Results: MasterBond EP30-2 epoxy |
Dennis Coyne et al. |
Vacuum
System Engineering
|
08 Apr 2014 |
| D1300036-v1 |
Prism Bond Curing Oven |
Bob Taylor |
Fabrication
|
15 Jan 2013 |
| E1000192-v1 |
Optical Contamination Cavity Test Results: Q3000 QUAD IR PHOTO DIODES |
Liyuan Zhang et al. |
Fabrication
|
26 Jul 2011 |
| E070273-v1 |
Process Traveler - HAM cable cleaning |
Stephany Foley et al. |
Seismic Isolation
Vacuum
|
23 Jun 2011 |
| E1100144-v1 |
Electropolished Aluminum -- outgassing test |
Dennis Coyne et al. |
System Engineering
Vacuum
|
27 Feb 2011 |
| E1000479-v1 |
Optical Contamination Test Results MasterBond EP30-2 samples on glass slides |
Liyuan Zhang et al. |
System Engineering
Vacuum
Suspensions
|
26 Sep 2010 |
| E1000376-v1 |
RGA Test Results: A-OSEM Circuit Board Sub-Assembly (223 units) |
Dennis Coyne et al. |
Suspensions
Incoming Inspection
Vacuum
System Engineering
|
01 Sep 2010 |
| E1000196-v1 |
Optical Contamination Cavity Test Results: New Focus Picomotor 830X-UHV |
Liyuan Zhang et al. |
Sensing and Control
System Engineering
Vacuum
|
25 Aug 2010 |
| E1000221-v1 |
Material Qualification RGA Test Results: Ferro Corporation RM108 Frit |
Dennis Coyne et al. |
Vacuum
Auxiliary Optics
|
17 Jun 2010 |
| E1000198-v1 |
Optical Contamination Cavity Test Results: Optek OP232 Emitter and Centronics BPX65 |
Liyuan Zhang et al. |
Suspensions
System Engineering
Vacuum
|
04 Jun 2010 |
| E1000199-v1 |
Material Qualification RGA Test Results: Optek OP232 Emitter and Centronics BPX65 |
Dennis Coyne et al. |
Suspensions
Vacuum
System Engineering
|
04 Jun 2010 |
| E1000179-v1 |
Optical Contamination Cavity Test Results: Semitron ESd 480 PEEK from Boedeker Plastics |
Liyuan Zhang et al. |
Suspensions
Vacuum
|
02 Jun 2010 |
| E1000170-v1 |
Optical Contamination Cavity Test Results: Vishay IR-LED TSTS7100 |
Liyuan Zhang et al. |
Suspensions
Vacuum
|
02 Jun 2010 |
| T0900055-v1 |
Rehang of the Quad NP with glass masses but metal wires (January 12-23 2009) |
Douglas Cook et al. |
Suspensions
|
29 Apr 2009 |