Optical Contamination Test resuits: Euclid Compact Interferometer

Document #:

LIGO-E1800210-v1

Document type:

E - Engineering documents

Abstract:

Manufacturer:Birmingham School of Physics and Astronomy
Material:Aluminum & Glass Body with Laser Diode Electronic Circuitry In side Case.
S/N 20162601

Files in Document:

• E1800210-v1 Optical Contamination Test results Euclid ...pdf (447.0 kB)

Other Files:

• E1800210-v1 Optical Contamination Test results Euclid ...xls (1.0 MB)

Topics:

• Basic R&D

Authors:

• Robert Taylor
• Dennis Coyne

Keywords:

Euclid Laser OSEM Bermingham

Notes and Changes:

N.B.: Testing has been terminated after 215 days. This device marginally fails UHV compatibility testing based on the acceptance criteria and the assumption of 6 units per TM and BS suspensions. Measurements indicate loss rate (scaled to LIGO UHV) of 0.028 ppm/yr (2 sigma) absorption (compared to 0.02 criteria) and 0.129 ppm/yr scatter (compared to 0.2 criteria).

Related Documents:

• LIGO-E1000193: LIGO UHV Qualification Test Results
• LIGO-E1800210: Optical Contamination Test resuits: Euclid Compact Interferometer

Referenced by:

• LIGO-E1800210-v1: Optical Contamination Test resuits: Euclid Compact Interferometer